电化学沉积制备高结晶度金箔
2021-07-14王帅顾嫣芸缪鑫姚杰高铭良万茜
王帅 顾嫣芸 缪鑫 姚杰 高铭良 万茜



【摘 要】论文介绍了一种简单、廉价的外延沉积方法,以传统的单晶硅为基底,在三水合金酸氯化金水溶液(HAuCl4·3H2O,0.1mM)中沉积高度结晶的金薄膜。单晶硅已被证明是高度结晶半导体、光学材料和超导体外延生长的理想衬底。电化学沉积的金箔沿着作为阴极的单晶硅衬底的晶向形成。通过石英晶体微天平定量地得到了薄膜厚度随时间的变化规律,薄膜厚度可由施加电压在0.1mM固定浓度下控制。为将金膜转移到硅衬底上,在光照射下通过硅氧化法制备了一层薄氧化物(SiOx)层。
【Abstract】In this paper, a simple and inexpensive epitaxial deposition method was introduced, in which a highly crystalline gold film was deposited in an aqueous solution (HAuCl4·3H2O,0.1mM) of trihydrate alloyed acid gold chloride on a traditional monocrystalline silicon substrate. Monocrystalline silicon has proved to be an ideal substrate for the epitaxial growth of highly crystalline semiconductors, optical materials and superconductors. The electrodeposited gold foil is formed along the crystal direction of the monocrystalline silicon substrate that serves as the cathode. The variation of film thickness with time was obtained quantitatively by using quartz crystal microbalance. The film thickness can be controlled by applying voltage at a fixed concentration of 0.1mm. In order to transfer the gold film to the silicon substrate, a thin oxide (SiOx) layer was prepared by silicon oxidation under light irradiation.
【关键词】电化学沉积;金箔;单晶硅;可控厚度;刻蚀;晶格
【Keywords】electrochemical deposition; gold foil; single crystal silicon; controllable thickness; etching; lattice
【中图分类号】TB33;TN304.0 【文獻标志码】A 【文章编号】1673-1069(2021)06-0182-04
1 引言
单晶硅(Si)是半导体器件的基础,其高结晶度使电子-空穴复合作用最小,其致密的天然氧化物(SiOx)保证了最小的表面态。工业界希望超越常规平面结构来生产柔性电子设备,如可穿戴太阳能电池、传感器和柔性显示器[1]。导电聚合物、碳纳米管、石墨烯和金属纳米结构已经用作柔性电子设备的透明柔性基板。超薄(5~30nm)金属膜具有相对较高的光学透射率、柔韧性、良好的器件效率和较低的薄层电阻。然而,它们通常通过真空热蒸发或溅射生长,从而产生多晶或质地不平的沉积,多晶电子材料在晶界处容易发生电子-空穴复合[2]。为将电子材料的应用范围扩展到平面Si之外,需要一种廉价高度有序的材料,该材料可以用作无晶界自由半导体,光学材料和超导体外延生长的惰性衬底[3]。……
